Switch Probe with Ball Head for Lateral Contacting
These versions allow lateral detection of components and contours, as lateral forces are being deflected.
Function:
Due to a free-rolling ball, the forces occurring from the side can be deflected and used to actuate the integrated switch. This principle means that the probes leave no scratch marks on the contact surface and protect the test item. Also, switch probes with a ball head have a much longer lifetime in applications with lateral contacts than conventional contact probes with a rounded head.
Typical applications:
Lateral presence detection of components and connectors, holes and screws in test modules.