Datos técnicos
| General | |
|---|---|
| Estructura | Basic Contact Probe |
| Tipo/Familia | FL100 |
| Paso (mm/mil) | 2,54 / 100 |
| Temperatura | -45°C...+100°C |
| Definición adicional | E21 |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 47.5 |
| Altura sobresaliente (mm) | 21.4 |
| Diámetro del estilo de punta (mm) | 0.15 |
| Diámetro del casquillo (mm) | 1.65 |
| Diámetro del collar (mm) | 2.3 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 10 |
| Material del émbolo | Steel |
| Recubrimiento del émbolo | Longtime Gold |
| Material del casquillo | Brass |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 60 |
| Fuerza del resorte (cN) | 150 |
| Recorrido nominal (mm) | 4.3 |
| Recorrido máximo (mm) | 6.4 |
| Precisión de punteo +/- (mm) | 0.08 |
| Rosca | M1,6 |
| Tamaño de herramienta (mm) | 1,7 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 5 |
| Resistencia de contacto típica (mΩ) | 25 |
Gráficos
Beschreibung des Produkts
The Flying Probe FL10010S015L150E21M (item number 1033253) is a movable spring-loaded Contact Probe for automated PCB testing. As a Flying Probe, FL10010S015L150E21M can access individual test points without a fixed bed-of-nails fixture, making it suitable for prototypes, small batches and frequently changing layouts. FL10010S015L150E21M operates as a flying-probe solution that contacts individual test points without a fixed bed-of-nails fixture, supporting changing layouts, prototypes and high-mix testing. Mechanical design data includes pitch 2.54 mm / 100 mil, tip style 10 (Flexible needle), tip diameter 0.15 mm, spring force 150 cN, nominal travel 4.3 mm, maximum travel 6.4 mm. Electrical specifications for FL10010S015L150E21M include continuous current 5 A, typical contact resistance 25 mΩ. The plunger in FL10010S015L150E21M is made of steel and uses Longtime Gold plating.