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FL10010S015L150E21M Perspective 1 FL10010S015L150E21M Perspective 2

Flying Probes (For Seica test systems) FL10010S015L150E21M

Item number 1033253

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family FL100
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+100°C
Additional definition E21
Dimensions
Total length (mm) 47.5
Protrusion height (mm) 21.4
Tip style diameter (mm) 0.15
Barrel diameter (mm) 1.65
Collar diameter (mm) 2.3
Materials and surfaces
Tip style 10
Plunger material Steel
Plunger plating Longtime Gold
Barrel material Brass
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Mechanical specifications
Preload (cN) 60
Spring force (cN) 150
Nominal travel (mm) 4.3
Maximum travel (mm) 6.4
Pointing accuracy +/- (mm) 0.08
Thread M1,6
Tool size (mm) 1,7
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

FL10010S015L150E21M Family designation FL10010S015L150E21M Tip style 1

Beschreibung des Produkts

The Flying Probe FL10010S015L150E21M (item number 1033253) is a movable spring-loaded Contact Probe for automated PCB testing. As a Flying Probe, FL10010S015L150E21M can access individual test points without a fixed bed-of-nails fixture, making it suitable for prototypes, small batches and frequently changing layouts. FL10010S015L150E21M operates as a flying-probe solution that contacts individual test points without a fixed bed-of-nails fixture, supporting changing layouts, prototypes and high-mix testing. Mechanical design data includes pitch 2.54 mm / 100 mil, tip style 10 (Flexible needle), tip diameter 0.15 mm, spring force 150 cN, nominal travel 4.3 mm, maximum travel 6.4 mm. Electrical specifications for FL10010S015L150E21M include continuous current 5 A, typical contact resistance 25 mΩ. The plunger in FL10010S015L150E21M is made of steel and uses Longtime Gold plating.