Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-D |
| Paso (mm/mil) | 0,50 / 20 |
| Temperatura | -45°C...+150°C |
| Definición adicional | H |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 7.6 |
| Altura sobresaliente (mm) | 1.5 |
| Diámetro del estilo de punta (mm) | 0.21 |
| Diámetro del casquillo (mm) | 0.35 |
| Diámetro del estilo de punta (mm) 2 | 0.17 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 29 |
| Estilo de punta 2 | 01 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | High-grade steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 8 |
| Fuerza del resorte (cN) | 20 |
| Recorrido nominal (mm) | 0.65 |
| Recorrido máximo (mm) | 0.75 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 2 |
| Resistencia de contacto típica (mΩ) | 80 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP350D2901B021G020L076 (item number 1114002) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP350D2901B021G020L076 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP350D2901B021G020L076, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP350D2901B021G020L076 includes pitch 0.5 mm / 20 mil, spring force 20 cN, continuous current 2 A.