The Fine Pitch Double Plunger Probe FP350D2901B021G020L076 (item number 1114002) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP350D2901B021G020L076 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP350D2901B021G020L076, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP350D2901B021G020L076 includes pitch 0.5 mm / 20 mil, spring force 20 cN, continuous current 2 A.
