Données techniques
| Généralités | |
|---|---|
| Structure | Double Plunger Probe |
| Type/famille | FP-D |
| Pas (mm/mil) | 0,40 / 16 |
| Température | -45°C...+150°C |
| Dimensions | |
|---|---|
| Longueur totale (mm) | 5.7 |
| Hauteur hors tout (mm) | 1.1 |
| Diamètre du style de pointe (mm) | 0.15 |
| Diamètre du fût (mm) | 0.3 |
| Diamètre du style de pointe (mm) 2 | 0.15 |
| Matériaux et surfaces | |
|---|---|
| Style de pointe | 29 |
| Style de pointe 2 | 01 |
| Matériau du piston | Palladium |
| Revêtement du piston | Uncoated |
| Matériau du fût | Nickel |
| Revêtement du fût | Gold |
| Matériau du ressort | High-grade steel |
| Revêtement du ressort | Gold |
| Matériau du piston 2 | Beryllium copper |
| Revêtement du piston 2 | Gold |
| Spécifications mécaniques | |
|---|---|
| Précontrainte (cN) | 3 |
| Force du ressort (cN) | 25 |
| Course nominale (mm) | 0.65 |
| Course maximale (mm) | 0.8 |
| Spécifications électriques | |
|---|---|
| Courant continu (A) | 1.4 |
| Résistance de contact typique (mΩ) | 100 |
| Fréquence (GHz) | 13.6 |
Graphiques
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP300D2901P015U025L057H (item number 1024430) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901P015U025L057H at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901P015U025L057H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.4 mm / 16 mil, spring force 25 cN, continuous current 1.4 A. As an H version, FP300D2901P015U025L057H extends the operating range to high-temperature applications up to 200 °C.