The Basic Contact Probe F10017B150G100 (item number 1000619) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B150G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B150G100 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. For F10017B150G100, spring force is 100 cN at a nominal travel of 4.3 mm. F10017B150G100 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10017B150G100 is made of beryllium copper and is gold-plated.
