Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F100 |
| Pitch (mm/mil) | 2,54 / 100 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 33.3 |
| Protrusion height (mm) | 8.5 |
| Tip style diameter (mm) | 1.5 |
| Barrel diameter (mm) | 1.37 |
| Materials and surfaces | |
|---|---|
| Tip style | 17 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Nickel |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 40 |
| Spring force (cN) | 100 |
| Nominal travel (mm) | 4.3 |
| Maximum travel (mm) | 6.4 |
| Pointing accuracy +/- (mm) | 0.08 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 5 |
| Typical contact resistance (mOhm) | 20 |
Graphics
Beschreibung des Produkts
The Basic Contact Probe F10017B150G100 (item number 1000619) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B150G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B150G100 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. For F10017B150G100, spring force is 100 cN at a nominal travel of 4.3 mm. F10017B150G100 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10017B150G100 is made of beryllium copper and is gold-plated.