For high-density contacting, FP680D1616S036L085L245 (item number 1118519) provides a compact spring-loaded probe solution. Tip style 16 (Flat) targets FP680D1616S036L085L245 at solder pads and contact pins in dense test layouts; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP680D1616S036L085L245, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.8 mm / 31 mil with tip style 16 (Flat) and a tip diameter of 0.36 mm. FP680D1616S036L085L245 operates with 85 cN spring force and 2 mm nominal travel. FP680D1616S036L085L245 is specified for 1.5 A continuous current.
