F77217B200G300H (item number 1125623) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 17 (Flat stepped), F77217B200G300H combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B200G300H combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. F77217B200G300H operates with 300 cN spring force and 4 mm nominal travel. F77217B200G300H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F77217B200G300H is made of beryllium copper and is gold-plated. As an H version, F77217B200G300H extends the operating range to high-temperature applications up to 200 °C.
