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F77217B200G300H Perspective 1 F77217B200G300H Perspective 2

Basic Contact Probes (100 mil) F77217B200G300H

Item number 1125623

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+100°C
Additional definition H
Dimensions
Total length (mm) 32
Protrusion height (mm) 10
Tip style diameter (mm) 2
Barrel diameter (mm) 1.66
Press ring diameter (mm) 2.05
Materials and surfaces
Tip style 17
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material High-grade steel
Spring plating Uncoated
Mechanical specifications
Preload (cN) 100
Spring force (cN) 300
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 100

Graphics

F77217B200G300H Family designation F77217B200G300H Tip style 1

Beschreibung des Produkts

F77217B200G300H (item number 1125623) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 17 (Flat stepped), F77217B200G300H combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B200G300H combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. F77217B200G300H operates with 300 cN spring force and 4 mm nominal travel. F77217B200G300H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F77217B200G300H is made of beryllium copper and is gold-plated. As an H version, F77217B200G300H extends the operating range to high-temperature applications up to 200 °C.