The Fine Pitch Double Plunger Probe FP580D2929B030G040L059 (item number 1001490) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP580D2929B030G040L059 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D2929B030G040L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP580D2929B030G040L059 includes pitch 0.75 mm / 30 mil, spring force 40 cN, continuous current 3.5 A.
