F76828B090G130 (item number 1001615) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 28 (4-point crown stepped), F76828B090G130 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. The design combines a pitch of 1.27 mm / 50 mil with tip style 28 (4-point crown stepped) and a tip diameter of 0.9 mm. For F76828B090G130, spring force is 130 cN at a nominal travel of 3.2 mm. F76828B090G130 is rated for 3 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F76828B090G130 is made of beryllium copper and is gold-plated.
