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F76828B090G130 Perspective 1 F76828B090G130 Perspective 2

Basic Contact Probes (50 mil) F76828B090G130

Item number 1001615

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F768
Pitch (mm/mil) 1,27 / 50
Temperature -45°C...+80°C
Dimensions
Total length (mm) 37
Protrusion height (mm) 13.6
Tip style diameter (mm) 0.9
Barrel diameter (mm) 0.79
Materials and surfaces
Tip style 28
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 50
Spring force (cN) 130
Nominal travel (mm) 3.2
Maximum travel (mm) 4
Pointing accuracy +/- (mm) 0.07
Electrical specifications
Continuous current (A) 3
Typical contact resistance (mOhm) 20

Graphics

F76828B090G130 Family designation F76828B090G130 Tip style 1

Beschreibung des Produkts

F76828B090G130 (item number 1001615) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 28 (4-point crown stepped), F76828B090G130 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. The design combines a pitch of 1.27 mm / 50 mil with tip style 28 (4-point crown stepped) and a tip diameter of 0.9 mm. For F76828B090G130, spring force is 130 cN at a nominal travel of 3.2 mm. F76828B090G130 is rated for 3 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F76828B090G130 is made of beryllium copper and is gold-plated.