As a Basic Contact Probe, F77206B250G150H (item number 1019475) establishes a spring-loaded electrical connection to the test point. With tip style 06 (Serrated stepped), F77206B250G150H combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F77206B250G150H combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 2.5 mm. For F77206B250G150H, spring force is 150 cN at a nominal travel of 4 mm. F77206B250G150H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F77206B250G150H is made of beryllium copper and is gold-plated. In this H configuration, F77206B250G150H is part of the high-temperature range and can be used in applications up to 200 °C.
