The Fine Pitch Double Plunger Probe FP380D2901P022U025L030 (item number 1023006) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P022U025L030 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P022U025L030, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.5 mm / 20 mil, spring force 25 cN, continuous current 1.1 A.
