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FP380D2901P022U025L030 Perspective 1 FP380D2901P022U025L030 Perspective 2

Fine Pitch Probes (300µm - 500µm) FP380D2901P022U025L030

Item number 1023006

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,50 / 20
Temperature -45°C...+120°C
Dimensions
Total length (mm) 3
Protrusion height (mm) 0.6
Tip style diameter (mm) 0.22
Barrel diameter (mm) 0.38
Tip style diameter (mm) 2 0.22
Materials and surfaces
Tip style 29
Tip style 2 01
Plunger material Palladium
Plunger plating Uncoated
Barrel material Nickel
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 15
Spring force (cN) 25
Nominal travel (mm) 0.4
Maximum travel (mm) 0.55
Electrical specifications
Continuous current (A) 1.1
Typical contact resistance (mOhm) 120
Frequency (GHz) 20

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FP380D2901P022U025L030 Family designation FP380D2901P022U025L030 Tip style 1 FP380D2901P022U025L030 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP380D2901P022U025L030 (item number 1023006) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P022U025L030 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P022U025L030, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.5 mm / 20 mil, spring force 25 cN, continuous current 1.1 A.