The Basic Contact Probe F10117B150N060E16 (item number 1030410) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10117B150N060E16 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10117B150N060E16 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. For F10117B150N060E16, spring force is 60 cN at a nominal travel of 4.3 mm. The electrical rating of F10117B150N060E16 combines 5 A continuous current with 40 mΩ typical contact resistance. The plunger is made of beryllium copper and is Nickel-plated.
