For high-density contacting, FP580D0303B030G060L059 (item number 1043612) provides a compact spring-loaded probe solution. Tip style 03 (Conical 60°) targets FP580D0303B030G060L059 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D0303B030G060L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.75 mm / 30 mil with tip style 03 (Conical 60°) and a tip diameter of 0.3 mm. For FP580D0303B030G060L059, spring force is 60 cN at a nominal travel of 0.5 mm. The continuous-current rating of FP580D0303B030G060L059 is 3.5 A.
