F77206B200G300H (item number 1001625) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 06 (Serrated stepped), F77206B200G300H combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F77206B200G300H combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 2 mm. F77206B200G300H operates with 300 cN spring force and 4 mm nominal travel. F77206B200G300H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F77206B200G300H is made of beryllium copper and is gold-plated. The H suffix on F77206B200G300H denotes the high-temperature variant, designed for applications up to 200 °C.
