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F77206B180G150E13 Perspective 1 F77206B180G150E13 Perspective 2

标准探针 (100 mil) F77206B180G150E13

商品编号 1009365

技术数据表

数量

技术数据

一般信息
结构 Basic Contact Probe
类型/系列 F772
间距(mm/mil) 2,54 / 100
温度 -45°C...+80°C
附加定义 EXX
尺寸
总长度 (mm) 35
突出高度(毫米) 13
针头直径 (mm) 1.8
针管直径 (mm) 1.66
领圈直径 (mm) 2.04
压环直径 (mm) 2.04
材料和表面
头型 06
柱塞材料 Beryllium copper
柱塞镀层 Gold
针管材料 Nickel silver
针管镀层 Gold
弹簧材料 Spring steel
弹簧镀层 Silver
机械规格
预紧力(cN) 20
弹力 (cN) 150
标准行程 (mm) 4
最大行程 (mm) 5
定位精度 +/- (mm) 0.08
电气规格
电流 (A) 5
接触电阻(mOhm) 25

图形

F77206B180G150E13 家族图示 F77206B180G150E13 头型 1

Beschreibung des Produkts

F77206B180G150E13 (item number 1009365) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 06 (Serrated stepped), F77206B180G150E13 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F77206B180G150E13 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.8 mm. For F77206B180G150E13, spring force is 150 cN at a nominal travel of 4 mm. F77206B180G150E13 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77206B180G150E13 is made of beryllium copper and is gold-plated.