As a Basic Contact Probe, F10006B200G300IK04 (item number 1011381) establishes a spring-loaded electrical connection to the test point. With tip style 06 (Serrated stepped), F10006B200G300IK04 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B200G300IK04 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 2 mm. For F10006B200G300IK04, spring force is 300 cN at a nominal travel of 4.3 mm. F10006B200G300IK04 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10006B200G300IK04 is made of beryllium copper and is gold-plated.
