F10006B150G200IK04 (item number 1013033) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 06 (Serrated stepped), F10006B150G200IK04 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B150G200IK04 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.5 mm. F10006B150G200IK04 operates with 200 cN spring force and 4.3 mm nominal travel. F10006B150G200IK04 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10006B150G200IK04 is made of beryllium copper and is gold-plated.
