As a Basic Contact Probe, F07506B130G200IK04 (item number 1017486) establishes a spring-loaded electrical connection to the test point. With tip style 06 (Serrated stepped), F07506B130G200IK04 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. The design combines a pitch of 1.9 mm / 75 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.7 mm. F07506B130G200IK04 operates with 200 cN spring force and 4.3 mm nominal travel. F07506B130G200IK04 is rated for 4 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F07506B130G200IK04 is made of beryllium copper and is gold-plated.
