As a Basic Contact Probe, F07537B050G200 (item number 1017505) establishes a spring-loaded electrical connection to the test point. With tip style 37 (4-point crown stepped), F07537B050G200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F07537B050G200 combines a pitch of 1.9 mm / 75 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. F07537B050G200 operates with 200 cN spring force and 4.3 mm nominal travel. F07537B050G200 is rated for 4 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F07537B050G200 is made of beryllium copper and is gold-plated.
