As a Basic Contact Probe, F10014B150G400 (item number 1017696) establishes a spring-loaded electrical connection to the test point. With tip style 14 (4-point crown stepped (self-cleaning)), F10014B150G400 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014B150G400 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.5 mm. F10014B150G400 operates with 400 cN spring force and 4.3 mm nominal travel. The electrical rating of F10014B150G400 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10014B150G400 is made of beryllium copper and is gold-plated.
