The Basic Contact Probe F10015B150G150H (item number 1022923) is a spring-loaded probe for temporary electrical contact with test points. With tip style 15 (Triangular 45° stepped), F10015B150G150H combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10015B150G150H combines a pitch of 2.54 mm / 100 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 1.5 mm. F10015B150G150H operates with 150 cN spring force and 4.3 mm nominal travel. F10015B150G150H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F10015B150G150H is made of beryllium copper and is gold-plated. The final H identifies the high-temperature version; F10015B150G150H is suitable for applications up to 200 °C.
