The Fine Pitch Double Plunger Probe FP200D0301B010G017L037 (item number 1023002) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP200D0301B010G017L037 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200D0301B010G017L037, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP200D0301B010G017L037 includes pitch 0.3 mm / 12 mil, spring force 17 cN, continuous current 0.8 A.
