The Fine Pitch Double Plunger Probe FP300D0301B015G030L057 (item number 1023125) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP300D0301B015G030L057 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D0301B015G030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP300D0301B015G030L057 includes pitch 0.4 mm / 16 mil, spring force 30 cN, continuous current 1.4 A.
