The Fine Pitch Double Plunger Probe FP380D2901P019U030L087 (item number 1024574) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P019U030L087 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P019U030L087, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.5 mm / 20 mil, spring force 30 cN, continuous current 2.1 A.
