The Fine Pitch Double Plunger Probe FP280D2901B013G015L057 (item number 1031134) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP280D2901B013G015L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP280D2901B013G015L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP280D2901B013G015L057 includes pitch 0.35 mm / 14 mil, spring force 15 cN, continuous current 1.5 A.
