The Fine Pitch Double Plunger Probe FP480D2929B022G046L046NM (item number 1031177) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP480D2929B022G046L046NM at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP480D2929B022G046L046NM, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.65 mm / 26 mil, spring force 46 cN, continuous current 2.3 A.
