语言:
备忘清单 ( 产品):
FL10030S060L150E21M Perspective 1 FL10030S060L150E21M Perspective 2

飞针 (用于 SEICA 测试系统) FL10030S060L150E21M

商品编号 1033270

技术数据表

数量

技术数据

一般信息
结构 Basic Contact Probe
类型/系列 FL100
间距(mm/mil) 2,54 / 100
温度 -45°C...+100°C
附加定义 E212
尺寸
总长度 (mm) 47.5
突出高度(毫米) 21.4
针头直径 (mm) 0.6
针管直径 (mm) 1.65
领圈直径 (mm) 2.3
材料和表面
头型 30
柱塞材料 Pinion Steel
柱塞镀层 Longtime Gold
针管材料 Brass
针管镀层 Gold
弹簧材料 Spring steel
弹簧镀层 Gold
机械规格
预紧力(cN) 60
弹力 (cN) 150
标准行程 (mm) 4.3
最大行程 (mm) 6.4
定位精度 +/- (mm) 0.08
螺纹式 M1,6
工具尺寸 (mm) 1,7
电气规格
电流 (A) 5
接触电阻(mOhm) 25

图形

FL10030S060L150E21M 家族图示 FL10030S060L150E21M 头型 1

Beschreibung des Produkts

The Flying Probe FL10030S060L150E21M (item number 1033270) is a movable spring-loaded Contact Probe for automated PCB testing. As a Flying Probe, FL10030S060L150E21M can access individual test points without a fixed bed-of-nails fixture, making it suitable for prototypes, small batches and frequently changing layouts. FL10030S060L150E21M operates as a flying-probe solution that contacts individual test points without a fixed bed-of-nails fixture, supporting changing layouts, prototypes and high-mix testing. Mechanical design data includes pitch 2.54 mm / 100 mil, tip style 30 (Triangular 45°), tip diameter 0.6 mm, spring force 150 cN, nominal travel 4.3 mm, maximum travel 6.4 mm. Electrical specifications for FL10030S060L150E21M include continuous current 5 A, typical contact resistance 25 mΩ. The plunger is made of triebstahl and uses Longtime Gold plating.