The Fine Pitch Double Plunger Probe FP510D1111S036L050L243 (item number 1043602) is designed for precise contacting where installation space is limited. Tip style 11 (Spherical) targets FP510D1111S036L050L243 at clean, sensitive contact surfaces; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP510D1111S036L050L243, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP510D1111S036L050L243 includes pitch 0.7 mm / 28 mil, spring force 50 cN, continuous current 1 A.
