The Contact Probe F56417B400G135 (item number 1148998) provides a defined electrical connection within the test setup. On F56417B400G135, electrical contact is established only at the intended penetration depth, making the Step Probe suitable for position and presence checks on connectors. As a Spring Contact Probe, F56417B400G135 establishes temporary contact with test points and compensates for mechanical tolerances through its spring movement. Tip style 17 (Flat stepped) has a diameter of 4 mm. Spring force is 135 cN at a nominal travel of 4.2 mm. The pitch is 3.18 mm / 125 mil.
