F10014B130G400 (item number 1160293) is a Basic Contact Probe for repeatable temporary electrical connections between the test system and a test point. With tip style 14 (4-point crown stepped (self-cleaning)), F10014B130G400 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014B130G400 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.3 mm. For F10014B130G400, spring force is 400 cN at a nominal travel of 4.3 mm. For F10014B130G400, the specified continuous current is 5 A.
