The Basic Contact Probe F10028S106L100 (item number 1167777) is designed for repeated contacting of test points in electronic test fixtures. With tip style 28 (4-point crown stepped), F10028S106L100 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10028S106L100 combines a pitch of 2.54 mm / 100 mil with tip style 28 (4-point crown stepped) and a tip diameter of 1.06 mm. F10028S106L100 operates with 100 cN spring force and 4.3 mm nominal travel. The plunger in F10028S106L100 is made of steel and is Longtime gold-plated.
