The Basic Contact Probe F07515S120L200 (item number 1168163) is designed for repeated contacting of test points in electronic test fixtures. With tip style 15 (Triangular 45° stepped), F07515S120L200 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F07515S120L200 combines a pitch of 1.9 mm / 75 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 1.2 mm. For F07515S120L200, spring force is 200 cN at a nominal travel of 4.3 mm. F07515S120L200 is specified for 4 A continuous current.
