The Basic Contact Probe F07562S064L200 (item number 1168168) is designed for repeated contacting of test points in electronic test fixtures. With tip style 62 (Triangular 30°), F07562S064L200 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F07562S064L200 combines a pitch of 1.9 mm / 75 mil with tip style 62 (Triangular 30°) and a tip diameter of 0.64 mm. For F07562S064L200, spring force is 200 cN at a nominal travel of 4.3 mm. The continuous-current rating of F07562S064L200 is 4 A.
