F10079B050G200 (item number 1168372) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. F10079B050G200 belongs to the basic probe range for ICT/FCT, where tip geometry, spring force and surface finish are matched to the target test point. The design combines a pitch of 2.54 mm / 100 mil with tip style 79 (6-point crown flattened) and a tip diameter of 0.5 mm. For F10079B050G200, spring force is 200 cN at a nominal travel of 4.3 mm. F10079B050G200 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10079B050G200 is made of beryllium copper and is gold-plated.
