The Basic Contact Probe F10036S140L180 (item number 1168541) is designed for repeated contacting of test points in electronic test fixtures. With tip style 14 (4-point crown stepped (self-cleaning)), F10036S140L180 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10036S140L180 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.4 mm. F10036S140L180 operates with 180 cN spring force and 4.3 mm nominal travel. For F10036S140L180, the specified continuous current is 5 A.
