The Basic Contact Probe F10062S090L200 (item number 1170235) is designed for repeated contacting of test points in electronic test fixtures. With tip style 62 (Triangular 30°), F10062S090L200 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10062S090L200 combines a pitch of 2.54 mm / 100 mil with tip style 62 (Triangular 30°) and a tip diameter of 0.9 mm. For F10062S090L200, spring force is 200 cN at a nominal travel of 4.3 mm. F10062S090L200 is specified for 5 A continuous current.
