The Basic Contact Probe F10037S050L180 (item number 1170383) is designed for repeated contacting of test points in electronic test fixtures. With tip style 37 (4-point crown stepped), F10037S050L180 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10037S050L180 combines a pitch of 2.54 mm / 100 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. For F10037S050L180, spring force is 180 cN at a nominal travel of 4.3 mm. For F10037S050L180, the specified continuous current is 5 A.
