In order to meet the various test applications in electronics testing, connector testing, non-testing or many other test applications, there are a wide variety of contact shapes on the plunger. We generally refer to these as tip styles.
These have been supplemented over the years to meet the contacting of component legs, contact surfaces or connector contours as far as possible and to achieve an optimal or best possible contact surface.
The aggressiveness of the tip styles is also adapted depending on the application and test environment.
Below are some examples of how different tip styles can be used.