Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-D |
| Paso (mm/mil) | 0,75 / 30 |
| Temperatura | -45°C...+100°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 5.9 |
| Altura sobresaliente (mm) | 0.8 |
| Diámetro del estilo de punta (mm) | 0.3 |
| Diámetro del casquillo (mm) | 0.58 |
| Diámetro del estilo de punta (mm) 2 | 0.3 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 16 |
| Estilo de punta 2 | 29 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Silver |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 20 |
| Fuerza del resorte (cN) | 40 |
| Recorrido nominal (mm) | 0.5 |
| Recorrido máximo (mm) | 1 |
| Precisión de punteo +/- (mm) | 0.09 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 3.5 |
| Resistencia de contacto típica (mΩ) | 50 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP580D1629B030G040L059 (item number 1001489) is designed for precise contacting where installation space is limited. Tip style 16 (Flat) targets FP580D1629B030G040L059 at solder pads and contact pins in dense test layouts; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D1629B030G040L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP580D1629B030G040L059 includes pitch 0.75 mm / 30 mil, spring force 40 cN, continuous current 3.5 A.