Technical data
| General | |
|---|---|
| Structure | Double Plunger Probe |
| Type/family | FP-D |
| Pitch (mm/mil) | 0,75 / 30 |
| Temperature | -45°C...+100°C |
| Dimensions | |
|---|---|
| Total length (mm) | 5.9 |
| Protrusion height (mm) | 0.8 |
| Tip style diameter (mm) | 0.3 |
| Barrel diameter (mm) | 0.58 |
| Tip style diameter (mm) 2 | 0.3 |
| Materials and surfaces | |
|---|---|
| Tip style | 16 |
| Tip style 2 | 29 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Silver |
| Plunger material 2 | Beryllium copper |
| Plunger plating 2 | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 20 |
| Spring force (cN) | 40 |
| Nominal travel (mm) | 0.5 |
| Maximum travel (mm) | 1 |
| Pointing accuracy +/- (mm) | 0.09 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 3.5 |
| Typical contact resistance (mOhm) | 50 |
Graphics
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP580D1629B030G040L059 (item number 1001489) is designed for precise contacting where installation space is limited. Tip style 16 (Flat) targets FP580D1629B030G040L059 at solder pads and contact pins in dense test layouts; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D1629B030G040L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP580D1629B030G040L059 includes pitch 0.75 mm / 30 mil, spring force 40 cN, continuous current 3.5 A.