Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-D |
| Paso (mm/mil) | 0,50 / 20 |
| Temperatura | -45°C...+100°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 24.3 |
| Altura sobresaliente (mm) | 4 |
| Diámetro del estilo de punta (mm) | 0.27 |
| Diámetro del casquillo (mm) | 0.38 |
| Diámetro del estilo de punta (mm) 2 | 0.27 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 01 |
| Estilo de punta 2 | 01 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Longtime Gold |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | High-grade steel |
| Recubrimiento del resorte | Uncoated |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Longtime Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 10 |
| Fuerza del resorte (cN) | 50 |
| Recorrido nominal (mm) | 2 |
| Recorrido máximo (mm) | 2.5 |
| Precisión de punteo +/- (mm) | 0.04 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 1 |
| Resistencia de contacto típica (mΩ) | 250 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP380D0101B027L050L243 (item number 1003136) is designed for precise contacting where installation space is limited. Tip style 01 (Conical 90°) targets FP380D0101B027L050L243 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D0101B027L050L243, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D0101B027L050L243 includes pitch 0.5 mm / 20 mil, spring force 50 cN, continuous current 1 A.