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FP380D0101B027L050L243 Perspective 1 FP380D0101B027L050L243 Perspective 2

Fine Pitch Probes (300µm - 500µm) FP380D0101B027L050L243

Item number 1003136

Technical data sheet

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Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,50 / 20
Temperature -45°C...+100°C
Dimensions
Total length (mm) 24.3
Protrusion height (mm) 4
Tip style diameter (mm) 0.27
Barrel diameter (mm) 0.38
Tip style diameter (mm) 2 0.27
Materials and surfaces
Tip style 01
Tip style 2 01
Plunger material Beryllium copper
Plunger plating Longtime Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Uncoated
Plunger material 2 Beryllium copper
Plunger plating 2 Longtime Gold
Mechanical specifications
Preload (cN) 10
Spring force (cN) 50
Nominal travel (mm) 2
Maximum travel (mm) 2.5
Pointing accuracy +/- (mm) 0.04
Electrical specifications
Continuous current (A) 1
Typical contact resistance (mOhm) 250

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FP380D0101B027L050L243 Family designation FP380D0101B027L050L243 Tip style 1 FP380D0101B027L050L243 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP380D0101B027L050L243 (item number 1003136) is designed for precise contacting where installation space is limited. Tip style 01 (Conical 90°) targets FP380D0101B027L050L243 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D0101B027L050L243, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D0101B027L050L243 includes pitch 0.5 mm / 20 mil, spring force 50 cN, continuous current 1 A.