The Fine Pitch Double Plunger Probe FP380D0101B027L050L243 (item number 1003136) is designed for precise contacting where installation space is limited. Tip style 01 (Conical 90°) targets FP380D0101B027L050L243 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D0101B027L050L243, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D0101B027L050L243 includes pitch 0.5 mm / 20 mil, spring force 50 cN, continuous current 1 A.
