Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-DF |
| Paso (mm/mil) | 0,17 / 7 |
| Temperatura | -45°C...+120°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 4.7 |
| Altura sobresaliente (mm) | 0.6 |
| Diámetro del estilo de punta (mm) | 0.07 |
| Diámetro del casquillo (mm) | 0.11 |
| Diámetro del estilo de punta (mm) 2 | 0.07 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 03 |
| Estilo de punta 2 | 29 |
| Material del émbolo | Palladium |
| Recubrimiento del émbolo | Uncoated |
| Material del casquillo | Nickel |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Palladium |
| Recubrimiento del émbolo 2 | Uncoated |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 1.7 |
| Fuerza del resorte (cN) | 6 |
| Recorrido nominal (mm) | 0.4 |
| Recorrido máximo (mm) | 0.5 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 0.4 |
| Resistencia de contacto típica (mΩ) | 500 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP110DF0329P007U006L047 (item number 1040994) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP110DF0329P007U006L047 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP110DF0329P007U006L047, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.17 mm / 7 mil, spring force 6 cN, continuous current 0.4 A.